HORIBA has a long history of X-ray technologies since 1956 and we have continuously developed XRF analyzers with energy dispersive method. Once in the real environment, the external interference caused the system to fail repeatedly due to cross frequency interference and harmonics, which exceeded the allowed power level of the receiver.X-ray fluorescence (XRF) is a non-destructive elemental analytical technique to identify what elements are contained and to determine how much concentration of the elements are contained in a material based on the fluorescence X-ray signals emitted from a material.Īmong XRF analyzers, energy dispersive X-ray fluorescence (EDXRF) analyzers are more suitable for screening analysis on a wide variety of sample applications thanks to its non-destructive approach, multiple element detection, less sample preparation, and shorter measurement time.
When I was younger I recall an application when the entire design had to be scrapped and re-done after initial field testing of a radar system which worked great in the lab. The lower mechanical circuit frequency components leak into the high frequency circuits (and vice versa) so the design, especially the isolation/sealing/external filtering needs to be a major design consideration.
Higher frequency are the opposite.Īnother important consideration is having higher frequency circuits next to mechanical devices is not an easy task. Lower frequencies tend to penetrate better when they have to go through interference or attenuation due to atmospheric effects. (P4 conserves energy using lower frequency)Īlthough the frequencies and distance in this case are not high enough for the following radar law to apply, DJI may have considered it: Lower Downlink Frequency = Lower Power to achieve sufficient distance High Uplink Frequency = Higher Power to achieve greater distance
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